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Publications: |
1 - Ehab A. Hamed, Mohamed Atef and Mohamed Abbas. , A Low Power Programmable Gain Integrated Front-End for Electromyogram Signal Sensing, 25th International Conference Mixed Design of Integrated Circuits and Systems, IEEE, 103-108, https://www.mixdes.org/Mixdes3/, June, 2018
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2 - Ehab A. Hamed, Mohamed Atef and Mohamed Abbas, An Ultralow-Power High-Gain Biopotential Amplifier for Electromyogram Signal Recording., Electronics, Communications and Computers (JAC-ECC), 2017 Japan-Africa Conference, IEEE, https://sites.google.com/a/ejust.kyushu-u.ac.jp/jac-ecc-2017/, December, 2017
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3 - Ehab A. Hamed, Mohamed Atef, Mohamed Abbas, R. R. Gharieb , Transferring Electromyogram Signal between Limbs, Fourth International Japan-Egypt Conference on Electronics, Communications and Computers (JEC-ECC) , IEEE, 141-144, https://sites.google.com/a/ejust.kyushu-u.ac.jp/jec-ecc-2016/, May, 2016
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4 - Mohamed Abbas, Kasem Khalil, A 23ps resolution Time-to-Digital converter implemented on low-cost FPGA platform, Signals, Circuits and Systems (ISSCS), 2015 International Symposium on , IEEE, , 1-4 , , July, 2015
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5 - Nahla T. Abou-El-Kheir, Mohamed Abbas and Mohammed EssamKhedr, An Adaptive Digital Background Calibration Technique using Variable Step Size LMS for Pipelined ADC, IEEE CSNDSP2014, July 2014, Manchester, UK, July, 2014
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6 - Nahla T. Abou-El-Kheir, Mohamed Abbas and Mohammed EssamKhedr, A Fast Power Efficient Equalization-Based Digital Background Calibration Technique for Pipelined ADC, IEEE MIXDES June 2014, Lublin, Poland, June, 2014
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7 - S. Komatsu, T. J. Yamaguchi, M. Abbas, N. Khanh, J. Tandon and K. Asada, A Flash TDC with 2.6-4.2ps Resolution Using a Group of Unbalanced CMOS Arbiters, IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences, Vol.E97-A - No.3, pp.777-780, March, 2014
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8 - K. Khalil, M. Abbas and M. Abdel-Gawad, A Low-Power Low-Delay Dispersion Comparator for High-Speed Level-Crossing ADCs, IEEE 2nd Saudi International Electronics, April, 2013
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9 - K. Khalil, M. Abbas and M. Abdel-Gawad, Novel Technique for Reducing the Comparator Delay Dispersion in 45nm CMOS Technology for Level-Crossing ADCs, Oral presentaion in ISCDG2012, Grenoble- France , 21 - 24 , September, 2012
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10 - T. J. Yamaguchi, S. Komatsu1, M Abbas, K. Asada1, N. Khanh and J. Tandon, CMOS Flash TDC with 0.84 – 1.3 ps Resolution Using Standard Cells, RFIC 2012, Montreal- Canada, June, 2012
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11 - M. Abbas, T. J. Yamaguchi, Y Furukawa, S. Komatsu and K. Asada, Low Delay Dispersion Comparator for Level-Crossing ADCs, Procedddings of IEEE JECECC2012, Alexanderia, Egypt , March, 2012
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12 - M. Abbas, Feedforward Compensation Technique for comparator delay dispersion for level-crossing ADCs, to be appear in Journal of Electrical Science (JES) Faculty of Engineering, Assiut University, May, 2012
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13 - K. Khalil, M. Abbas and M. Abdel-Gawad, A Low Propagation Delay Dispersion Comparator for Low Cost Level-Crossing ADCs, Oral presentaion in IDT2012, Doha- Qatar, December, 2012
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14 - M. Abbas, Fault Detection and Diagnoses Methodology for Adaptive Digitally-Calibrated Pipelined ADCs, Proceedings of IEEE IDT2011, Beirut, Lebanon, December, 2011
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15 - M. Abbas, T. J. Yamaguchi, Y Furukawa, S. Komatsu and K. Asada, Novel Technique for Minimizing the Comparator Delay Dispersion in 65nm CMOS Technology, Proceedings of IEEE ICECS2011, Beirut, Lebanon, December, 2011
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16 - T.J. Yamaguchi, M. Soma, T. Aoki, Y. Furukawa, K. Degawa, K. Asada, M. Abbas, S. Komatsu, Application of a Continuous-Time Level Crossing Quantization Method for Timing Noise Measurements, ITC, 2011
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17 - M. Abbas, Y. Furukawa, S. Komatsu , T. J. Yamaguchi and K. Asada, Clocked Comparator for High-Speed Applications in 65nm Technology, A-SSCC2010, China, Beijing, November, 2010
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18 - M. Abbas, An Automatic Test Generation Framework for Adaptive Mixed-Signal Systems, Invited Talk @ Advantest Research and Development Laboratory, Gunmma, Japan , January, 2010
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19 - M. Abbas, Cost-Effective Test Methodology for Analog and Mixed-Signals in SoCs, Invited Talk @ D2T Symposium, VDEC. The university of Tokyo, Japan, June, 2010
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20 - M. Abbas, K-T. Cheng, Y. Furukawa, S. Komatsu and K. Asada, An Automatic Test Generation Framework for Digitally-Assisted Adaptive Equalizers in High-Speed Serial Links , DATE2010, Germany, Dresden, March, 2009
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21 - M. Abbas, Y. Furukawa, S. Komatsu and K. Asada, An Automatic Test Generation Framework for Digitally-Assisted Adaptive Equalizers in High-Speed Serial Links, DATE2010, Germany, Dresden, September, 2009
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22 - M. Abbas, Y. Furukawa, S. Komatsu and K. Asada, Signature-Based Testing for Adaptive Digitally-Calibrated Pipelined Analog-to-Digital Converters, IEEE ASICON09, Changsha, China, October, 2009
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23 - M. Abbas, K-T. Cheng, Y. Furukawa, S. Komatsu and K. Asada, GA-Based Test Generation for Digitally-Assisted Adaptive Equalizers in High-Speed Serial Links, IEEE EWDTS, Moscow, Russia, September, 2009
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24 - M. Abbas, K-T. Cheng, Y. Furukawa, S. Komatsu and K. Asada, Signature-Based Testing for Digitally-Assisted Adaptive Equalizers in High-Speed Serial Links, IEEE Europian Test Symposium, ETS09, Sivilla, Apain, May, 2009
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25 - M. Abbas, M. Ikeda and K. Asada, On-chip detector for single-event noise sensing with voltage scaling function, IEICE TRANS, VOL. E89-C NO.3 , 370-376, March, 2006
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26 - M. Abbas, M. Ikeda and K. Asada, On-chip 8GHz Non-Periodic High-Swing Noise Detector, Proceedings of DATE 2006 , Germany, Munich, March, 2006
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27 - M. Abbas, M. Ikeda and K. Asada, Statistical Model for Logic Errors in CMOS Digital Circuits for Reliability-Driven Design Flow, Proceedings of DDECS06, Czech Republic, Prague, April, 2006
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28 - M. Abbas, M. Ikeda and K. Asada, Noise Immunity Investigation of Low power Design schemes, IEICE TRANS, VOL. E89-C. NO.8 , 8, 2006
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29 - M. Abbas, M. Ikeda and K. Asada, On-chip Detector for Non-Periodic High-Swing Noise Detection, Proc. of Int. SoC Design Conf. pp: 231-234, S. Korea, Seoul, October, 2005
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30 - M. Abbas, M. Ikeda and K. Asada, On-chip Non-Periodic High-Swing Noise Detector, Proc. of 12th IEEE Int. Conf. on Electronics, Circuits and System, Tunisia , Tunis, December, 2005
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31 - M. Abbas, M. Ikeda and K. Asada, Noise Effects on Performance of Low Power Design Schemes in Deep Submicron Regime, the 19th IEEE Int. Symp. On Defect and Fault Tolerance in VLSI, France, Cannes, October, 2004
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32 - M. Abbas, M. Ikeda and K. Asada, On High Noise Immunity CMOS Design Scheme with Low Leakage Power Consumption, 7th Int. Conf. on Solid-State and Integrated Circuit Technology, China, Beijing, October, 2004
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