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Determination of the optical constants of As–Se–Ag chalcogenide thick films with high precision for optoelectronics applications

Research Authors
ER Shaaban, Mohamed N Abd-el Salam, M Mohamed, MA Abdel-Rahim, AY Abdel-Latief
Research Abstract

NULL

Research Department
Research Journal
Journal of Materials Science: Materials in Electronics
Research Publisher
Springer US
Research Rank
1
Research Vol
28(18)
Research Website
NULL
Research Year
2017
Research Pages
13379-13390